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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	6020752	Issue Dt:	02/01/2000	Application #:	08941101	Filing Dt:	09/30/1997
Inventor:	NORIAKI SHIMASAKI
Title:	IC TESTING DEVICE ADAPTED TO SELECTIVELY USE I/O COMMON SYSTEM AND I/O SPLIT SYSTEM FUNCTIONS

Assignment: 1

Reel/Frame:

008864/0192

Recorded: 09/30/1997

Pages: 3

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

YOON, KI HYUK

Exec Dt:

09/12/1997

WOO, JOUNG WON

Exec Dt:

09/09/1997

CHOI, YOO JIN

Exec Dt:

09/09/1997

NAM, MI SOOK

Exec Dt:

09/09/1997

KIM, JONG HYUN

Exec Dt:

09/09/1997

Assignee:

LG ELECTRONICS INC.

YONGDUNGPO-KU

20, YOIDO-DONG

SEOUL, KOREA, REPUBLIC OF

Correspondent:

FINNEGAN, HENDERSON, FARABOW, ET AL.

MR. ERNEST F. CHAPMAN

1300 I. STREET, N.W.

WASHINGTON, D.C. 20005

Assignment: 2

Reel/Frame:

008835/0682

Recorded: 09/30/1997

Pages: 2

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignor:

SHIMASAKI, NORIAKI

Exec Dt:

09/18/1997

Assignee:

ADVANTEST CORPORATION

32-1, ASAHICHO 1-CHOME

NERIMA-KU, TOKYO 179, JAPAN

Correspondent:

STAAS & HALSEY

JAMES D. HALSEY, JR.

700 ELEVENTH STREET, N.W., SUITE 500

WASHINGTON, D.C. 20001

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