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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/14/2000
Application #:
08893404
Filing Dt:
07/11/1997
Inventors:
JACEK LAGOWSKI, PIOTR EDELMAN, MARSHALL D. WILSON
Title:
MEASUREMENT OF THE INTERFACE TRAP CHARGE IN AN OXIDE SEMICONDUCTOR LAYER INTERFACE
Assignment: 1
Reel/Frame:
008857/0951Recorded: 12/08/1997Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/10/1997
Exec Dt:
11/10/1997
Exec Dt:
11/10/1997
Assignee:
3650 SPECTRUM BOULEVARD, SUITE 130
TAMPA, FLORIDA 33612
Correspondent:
FISH & RICHARDSON P.C.
FRANK R. OCCHIUTI
225 FRANKLIN STREET
BOSTON, MA 02110-2804

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