Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/28/2000
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Application #:
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08924129
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Filing Dt:
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09/05/1997
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Inventors:
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PENG FANG, JIANG TAO
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Title:
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ASSESSING PLASMA INDUCED GATE DIELECTRIC DEGRADATION WITH STRESS INDUCED LEAKAGE CURRENT MEASUREMENTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 3453 |
| ONE AMD PLACE |
| SUNNYVALE, CALIFORNIA 94088 |
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| LOWE PRICE LEBLANC & BECKER |
| ARTHUR J. STEINER |
| 99 CANAL CENTER PLAZA |
| SUITE 300 |
| ALEXANDRIA, VA 22314 |
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