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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/02/2000
Application #:
09289519
Filing Dt:
04/09/1999
Inventors:
SANJAY K. YEDUR, BHANWAR SINGH, BHARATH RANGARAJAN
Title:
METHOD FOR DETECTING AND IDENTIFYING A LENS ABERRATION BY MEASUREMENT OF SIDEWALL ANGLES BY ATOMIC FORCE MICROSCOPY
Assignment: 1
Reel/Frame:
009894/0504Recorded: 04/09/1999Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/06/1999
Exec Dt:
03/29/1999
Exec Dt:
03/29/1999
Assignee:
P.O. BOX 3453
ONE AMD PLACE
SUNNYVALE, CALIFORNIA 94088
Correspondent:
RENNER, OTTO, BOISSELLE & SKLAR, PLL
THOMAS W. ADAMS
1621 EUCLID AVNEUE
NINETEENTH FLOOR
CLEVELAND, OHIO 44115

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