Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
05/16/2000
|
Application #:
|
09240110
|
Filing Dt:
|
01/29/1999
|
|
Inventors:
|
CHI-WEI CHANG, CHUNG-YI LEE
|
|
Title:
|
APPARATUS FOR DETECTING WAFER EDGE DEFECTS AND METHOD OF USING
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| NO. 121, PARK AVENUE 3, SCIENCE-BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN R.O.C |
|
|
|
|
| TUNG & ASSOCIATES |
| RANDY W. TUNG |
| 838 W. LONG LAKE ROAD |
| BLOOMFIELD HILLS, MICHIGAN 48032 |
|
|
Search Results as of:
04/29/2024 10:13 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
