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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
05/16/2000
Application #:
09057080
Filing Dt:
04/08/1998
Inventor:
JANUARY KISTER
Title:
HIGH TEMPERATURE PROBE CARD FOR TESTING INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
010721/0433Recorded: 03/31/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/23/1998
Assignee:
2424 WALSH AVENUE
SANTA CLARA, CALIFORNIA 95051
Correspondent:
LUMEN
MAREK ALBOSZTA
426 LOWELL AVENUE
PALO ALTO, CA 94301
Assignment: 2
Reel/Frame:
017125/0042Recorded: 02/06/2006Pages: 4
Conveyance:
MERGER (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/01/2001
Assignee:
1209 ORANGE STREET
WILMINGTON, DELAWARE 19801
Correspondent:
CHRISTOPHER M. SPLETZER, SR.
KULICKE AND SOFFA INDUSTRIES, INC.
2101 BLAIR MILL ROAD
WILLOW GROVE, PA 19090
Assignment: 3
Reel/Frame:
017519/0082Recorded: 04/24/2006Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/03/2006
Exec Dt:
03/03/2006
Assignee:
29 WOODLANDS INDUSTRIAL PARK E1
#04-01, NORTH TECH, LOBBY 1
SINGAPORE, SINGAPORE 757716
Correspondent:
EDWARD A. BECKER
2055 GATEWAY PLACE, SUITE 550
SAN JOSE, CA 95110-1089

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