Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/18/2000
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Application #:
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09012277
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Filing Dt:
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01/23/1998
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Inventors:
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CHRISTOPHER G. TALBOT, CHIWOEI WAYNE LO, LUIS CAMILO ORJUELA, LI WANG
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Title:
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METHOD AND APPARATUS FOR DETECTING DEFECTS IN WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1601 TECHNOLOGY DRIVE |
| SAN JOSE, CALIFORNIA 95115 |
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| BRUCE D. RITER |
| 101 FIRST STREET |
| SUITE 208 |
| LOS ALTOS, CA 94022 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 450A |
| SANTA CLARA, CALIFORNIA 95052 |
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| APPLIED MATERIALS, INC. |
| ATTN: PATENT GROUP |
| 2881 SCOTT BLVD. |
| M/S 2061 |
| SANTA CLARA, CA 95050 |
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