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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
08/22/2000
Application #:
09132220
Filing Dt:
08/11/1998
Inventors:
MASAHIRO WATANABE, TAKASHI HIROI, MAKI TANAKA, HIROYUKI SHINADA, YASUTSUGU USAMI
Title:
ELECTRON BEAM EXPOSURE OR SYSTEM INSPECTION OR MEASUREMENT APPARATUS AND ITS METHOD AND HEIGHT DETECTION APPARATUS
Assignment: 1
Reel/Frame:
009668/0018Recorded: 09/16/1998Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/03/1998
Exec Dt:
09/03/1998
Exec Dt:
09/03/1998
Exec Dt:
09/03/1998
Exec Dt:
09/03/1998
Assignee:
6, KANDA SURUGADAI 4-CHOME
CHIYODA-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
MELVIN KRAUS
1300 NORTH 17TH STREET, SUITE 1800
ARLINGTON, VIRGINIA 22209
Assignment: 2
Reel/Frame:
015017/0620Recorded: 03/01/2004Pages: 11
Conveyance:
SECURITY AGREEMENT
Assignor:
Exec Dt:
02/11/2004
Assignee:
5420 LBJ FREEWAY, SUITE 200
DALLAS, TEXAS 75240
Correspondent:
ALAN SCHNACKE
5420 LBJ FREEWAY, SUITE 200
DALLAS, TX 75240

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