Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/28/2000
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Application #:
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09072024
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Filing Dt:
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05/05/1998
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Inventor:
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KATSUYA NAKASHIMA
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Title:
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A SEMICONDUCTOR DEVICE WITH TEST CIRCUIT FOR HIGH ACCURACY CHIP TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-35 KITASHINIAGAWA 6-CHOME |
| SHINAGAWA-KU, TOKYO, JAPAN |
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| RADER, FISHMAN & GRAUER |
| RONALD P. KANANEN, ESQ. |
| SUITE 501 |
| 1233 20TH ST., N.W. |
| WASHINGTON, DC 20036 |
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