Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/28/2000
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Application #:
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09091931
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Filing Dt:
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06/24/1998
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Inventors:
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MAKOTO TABATA, SHINYA SATO
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Title:
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DEFECT ANALYSIS MEMORY FOR MEMORY TESTER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHICHO 1-CHOME, NERIMA-KU |
| TOKYO 179-0071, JAPAN |
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| GALLAGHER & LATHROP |
| DAVID N. LATHROP, ESQUIRE |
| A PROFESSIONAL CORPORATION |
| 601 CALIFORNIA STREET, SUITE 1111 |
| SAN FRANCISCO, CA 94108-2805 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHICHO 1-CHOME NERIMA-KU |
| TOKYO 179-0071, JAPAN |
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| GALLAGHER & LATHROP |
| DAVID N. LATHROP, ESQ. |
| 601 CALIFORNIA STREET |
| SUITE 1111 |
| SAN FRANCISCO, CA 94108-2805 |
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