Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/05/2000
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Application #:
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09198644
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Filing Dt:
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11/24/1998
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Inventors:
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KOJI TOMITA, MUNEO MAESHIMA, SHIGERU MATSUI, HITOSHI KOMURO, KAZUO TAKEDA
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Title:
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DEFECT INSPECTION APPARATUS FOR SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU |
| TOKYO 101-8010, JAPAN |
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| KENYON & KENYON |
| EDWARD W. GREASON |
| ONE BROADWAY |
| NEW YORK, NEW YORK 10004 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6, KANDA SURUGADAI 4-CHOME |
| CHIYODA-KU, TOKYO 101-8010, JAPAN |
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| KENYON & KENYON |
| EDWARD W. GREASON |
| ONE BROADWAY |
| NEW YORK, N.Y. 10004 |
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