Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/19/2000
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Application #:
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09042802
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Filing Dt:
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03/17/1998
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Inventors:
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KATUHIKO SUZUKI, TAKESHI ONISHI, HIDETAKA NAKAZAWA
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Title:
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IC TESTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 32-1, ASAHICHO 1-CHOME |
| NERIMA-KU, TOKYO 179-0071, JAPAN |
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| STAAS & HALSEY |
| JAMES D. HALSEY, JR. |
| 700 ELEVENTH STREET, N.W., STE. 500 |
| WASHINGTON, D.C. 20001 |
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