Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/16/2001
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Application #:
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09185428
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Filing Dt:
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11/03/1998
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Inventors:
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TAKAYUKI HOMMA, CHRISTOPHER E.D. CHIDSEY, MASAHARU WATANABE
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Title:
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METHOD OF DETECTING MICROSCOPIC DEFECTS EXISTING ON A SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2612, SHINOMIYA, HIRATSUKA-SHI |
| KANAGAWA, JAPAN |
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| 2612, SHINOMIYA, HIRATSUKA-SHI |
| STANFORD, CALIFORNIA 94305 |
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| WELSH & KATZ, LTD. |
| GERALD T. SHEKLETON, ESQ. |
| 120 SOUTH RIVERSIDE PLAZA/ 22ND FLOOR |
| CHICAGO, ILLINOIS 60603-3913 |
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