Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/16/2001
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Application #:
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08714563
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Filing Dt:
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09/16/1996
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Inventors:
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YUTAKA OHTA, HIROFUMI NISHIJO, AKIRA KOSUGI
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Title:
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METHOD FOR ANALYZING IMPURITIES WITHIN SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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CHIYODA-KU |
4-2, MARUNOUCHI 1 CHOME |
TOKYO, JAPAN |
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596-2,OOAZA JONOSHISHINDEN,KUBIKI-MURA,NAKAKUBIKI-GUN |
4-2, MARUNOUCHI 1 CHOME |
NIIGATA-KEN, JAPAN |
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RONALD R. SNIDER |
P.O. BOX 27613 |
WASHINGTON, DC 20038-7613 |
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