Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/27/2001
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Application #:
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09188468
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Filing Dt:
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11/09/1998
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Inventors:
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HIROSHI TAKENO, KEN AIHARA
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Title:
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METHOD OF DETERMINING OXYGEN PRECIPITATION BEHAVIOR IN A SILICON MONOCRYSTAL, METHOD OF DETERMINING A PROCESS FOR PRODUCING SILICON MONOCRYSTALLINE WAFERS, AND RECORDING MEDIUM CARRYING A PROGRAM FOR DETERMINING OXYGEN PRECIPITATION BEHAVIIOR IN A SILICON MONOCRYSTAL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| CHIYODA-KU |
| 4-2, MARUNOUCHI 1-CHOME |
| TOKYO, JAPAN |
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| LOEB & LOEB LLP |
| WILLIAM H. WRIGHT, ESQ. |
| 10100 SANTA MONICA BLVD. |
| 22ND FLOOR |
| LOS ANGELES, CA 90067-4164 |
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