Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/05/2001
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Application #:
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09511653
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Filing Dt:
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02/22/2000
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Inventor:
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Shih-Chin Lin
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Title:
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Method for testing dynamic random access memory under wafer-level-burn-in
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SCIENCE-BASED INDUSTRIAL PK. |
| NO. 3, LI-HSIN RD. 2 |
| HSIN-CHU CITY, TAIWAN |
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| HARNESS, DICKEY & PIERCE, PLC |
| THOMAS T. MOGA |
| PO BOX 828 |
| BLOOMFIELD HILLS, MI 48303 |
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