Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/03/2001
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Application #:
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09200137
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Filing Dt:
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11/25/1998
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Inventors:
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WILLIAM BAXTER JOYCE, RONALD EDWARD SCOTTI
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Title:
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METHOD FOR NONDESTRUCTIVELY MEASURING THE STRESS OF FABRICATED SEMICONDUCTOR CHIPS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 636 |
| 600 MOUNTAIN AVNEUE |
| MURRAY HILL, NEW JERSEY 07974 |
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| JEAN-MARC ZIMMERMAN, ESQ. |
| 226 ST. PAUL STREET |
| WESTFIELD, NJ 07090 |
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