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Patent Assignment Abstract of Title

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Total Assignments: 1

Patent #:	6255208	Issue Dt:	07/03/2001	Application #:	09236927	Filing Dt:	01/25/1999
Inventors:	WILLIAM EMMETT BERNIER, CLAUDE LOUIS BERTIN, ANIKUMAR CHINUPRASAD BHATT et al
Title:	SELECTIVE WAFER-LEVEL TESTING AND BURN-IN

Assignment: 1

Reel/Frame:

009736/0286

Recorded: 01/25/1999

Pages: 4

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

BERNIER, WILLIAM EMMETT

Exec Dt:

09/01/1998

BERTIN, CLAUDE LOUIS

Exec Dt:

08/26/1998

BHATT, ANILKUMAR CHINUPRASAD

Exec Dt:

09/02/1998

GAYNES, MICHAEL ANTHONY

Exec Dt:

09/02/1998

HEDBERG, ERIK LEIGH

Exec Dt:

08/27/1998

MURDESHWAR, NIKHIL M.

Exec Dt:

12/23/1998

PIERSON, MARK VINCENT

Exec Dt:

08/31/1998

TONTI, WILLIAM R.

Exec Dt:

08/26/1998

TOTTA, PAUL A.

Exec Dt:

09/08/1998

VAN HORN, JOSEPH JOHN

Exec Dt:

12/18/1998

ZALESINSKI, JERZY MARIA

Exec Dt:

08/26/1998

Assignee:

INTERNATIONAL BUSINESS MACHINES CORPORATION

NEW ORCHARD ROAD

ARMONK, NEW YORK 10504

Correspondent:

SCHMEISER, OLSEN & WATTS

DIANE E. SMITH

24 COMPUTER DRIVER WEST

ALBANY, NY 12205

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