Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/31/2001
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Application #:
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09462039
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Filing Dt:
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12/29/1999
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Inventor:
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ITARU IIDA
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Title:
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SYSTEM FOR TESTING SEMICONDUCTOR DEVICE FORMED ON SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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3-6 AKASAKA 5-CHOME, MINATO-KU |
TOKYO 107-8481, JAPAN |
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GRAHAM & JAMES LLP |
STEFAN J. KIRCHANSKI, ESQ. |
801 S. FIGUEROA ST. |
14TH FL. |
LOS ANGELES, CA 90017-5554 |
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