Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/07/2001
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Application #:
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09560126
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Filing Dt:
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04/28/2000
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Inventors:
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Mitsuyasu Ohta, Toshinori Hosokawa, Sadami Takeoka, Osamu Ichikawa
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Title:
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Semiconductor integrated circuit and method for testing the semiconductor integrated circuit
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1006, OAZA KADOMA, KADOMA-SHI |
| OSAKA 571-8501, JAPAN |
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| WENDEROTH, LIND & PONACK, L.L.P. |
| ATTN: NILS E. PEDERSEN, ESQ. |
| 2033 K STREET, N.W., SUITE 800 |
| WASHINGTON, DC 20006 |
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