Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/11/2001
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Application #:
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08991927
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Filing Dt:
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12/16/1997
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Inventors:
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CHRISTOPHER R FAIRLEY, TAO-YI FU, GERSHON PERELMAN, BIN-MING BENJAMIN TSAI
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Title:
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HIGH THROUGHPUT BRIGHTFIELD/DARKFIELD WAFER INSPECTION SYSTEM USING ADVANCED OPTICAL TECHNIQUES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| PILLSBURY WINTHROP LLP |
| STEVEN W. SMYRSKI, ESQ. |
| 725 SOUTH FIGUEROA STREET, SUITE 2800 |
| LOS ANGELES, CA 90017-5406 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 160 RIO ROBLES |
| SAN JOSE, CALIFORNIA 95134 |
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| SMYRSKI & LIVESAY, LLP |
| STEVEN W SMYRSKI |
| 3310 AIRPORT AVE., SW |
| SANTA MONICA, CA 90405 |
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