Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/18/2001
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Application #:
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09522590
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Filing Dt:
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03/10/2000
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Inventor:
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Jun Hasegawa
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Title:
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Semiconductor device and testing method therefor
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 72 HORIKAWA-CHO, SAIWAI-KU |
| KAWASAKI-SHI, JAPAN |
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| FOLEY & LARDNER |
| RICHARD L. SCHWAAB |
| WASHINGTON HARBOUR |
| 3000 K STREET, N.W., SUITE 500 |
| WASHINGTON, D.C. 20007-5109 |
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