Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/27/2001
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Application #:
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09620018
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Filing Dt:
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07/20/2000
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Inventors:
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Sung-Hoon Kim, Chul-Soo Kim
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Title:
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Semiconductor memory device capable of accurately testing for defective memory cells at a wafer level
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416 MAETAN-DONG, PALKAL-KU |
| SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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| MARGER, JOHNSON, & MCCOLLOM, P.C. |
| ALAN T. MCCOLLOM |
| 1030 S.W. MORRISON STREET |
| PORTLAND, OREGON 97205 |
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