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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
11/27/2001
Application #:
09352564
Filing Dt:
07/13/1999
Inventors:
JEFFREY O'DELL, MARK HARLESS, THOMAS VERBURGTR
Title:
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION
Assignment: 1
Reel/Frame:
010828/0234Recorded: 05/16/2000Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/05/2000
Exec Dt:
05/05/2000
Exec Dt:
05/05/2000
Assignee:
4900 WEST 78TH STREET
BLOOMINGTON, MINNESOTA 55435
Correspondent:
AUGUST TECHNOLOGY CORPORATION
JOHN M. VASUTA
4900 WEST 78TH STREET
BLOOMINGTON, MN 55435
Assignment: 2
Reel/Frame:
029583/0982Recorded: 12/20/2012Pages: 16
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/19/2012
Assignee:
ONE RUDOLPH ROAD
FLANDERS, NEW JERSEY 07836
Correspondent:
DICKE, BILLIG & CZAJA, PLLC
SUITE 2250
100 SOUTH FIFTH STREET
MINNEAPOLIS, MINNESOTA 55402

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