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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/11/2001
Application #:
09266915
Filing Dt:
03/12/1999
Inventor:
TAKESHI YASUDA
Title:
CHARACTERISTIC VARIATION EVALUATION METHOD OF SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
012259/0198Recorded: 10/17/2001Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/18/1999
Assignee:
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU
TOKYO 100-8310, JAPAN
Correspondent:
OBLIN, SPIVAK, MCCLELLAND, MAIER ET AL
MARVIN J. SPIVAK
FOURTH FLOOR
1755 JEFFERSON DAVIS HIGHWAY
ARLINGTON, VIRGINIA 22202

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