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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/01/2002
Application #:
09257246
Filing Dt:
02/25/1999
Inventor:
TSUTOMU MIYATAKE
Title:
APPARATUS FOR DETECTING POSITIONS OF WAFER AND MASK AND DEFORMATION ERROR DETECTING METHOD
Assignment: 1
Reel/Frame:
009797/0605Recorded: 02/25/1999Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/09/1999
Assignee:
5-9-11, KITA-SHINAGAWA
SHINAGAWA-KU, TOKYO, JAPAN
Correspondent:
NIKAIDO, MARMELSTEIN, MURRAY ET AL.
DAVID T. NIKAIDO
METROPOLITAN SQUARE, SUITE 330
G ST. LOBBY, 655 15TH STREET, N.W.
WASHINGTON, DC 20005-5701

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