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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/05/2002
Application #:
09396491
Filing Dt:
09/14/1999
Inventors:
TAKASHI GEMMA, HIROSHI ICHIHARA, HAJIME ICHIKAWA, SHIGERU NAKAYAMA, BRUCE JACOBSEN
Title:
INTERFEROMETRIC APPARATUS AND METHODS FOR MEASURING SURFACE TOPOGRAPHY OF A TEST SURFACE
Assignment: 1
Reel/Frame:
010419/0559Recorded: 11/24/1999Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/11/1999
Exec Dt:
11/11/1999
Exec Dt:
11/11/1999
Exec Dt:
11/02/1999
Exec Dt:
11/04/1999
Assignee:
FUJI BUILDING, 2-3, MARUNOUCHI 3-CHOME
CHIYODA-KU, TOKYO 100, JAPAN
Correspondent:
KLARQUIST SPARKMAN CAMPBELL ET AL
DONALD L. STEPHENS JR.
121 S.W. SALMON STREET
ONE WORLD TRADE CENTER, SUITE 1600
PORTLAND, OR 97204-2988

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