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Patent Assignment Abstract of Title

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Total Assignments: 1

Patent #:	6348690	Issue Dt:	02/19/2002	Application #:	09131383	Filing Dt:	08/07/1998
Inventors:	YUKO IWABUCHI, HIDEO TODOKORO, HIROYOSHI MORI, MITSUGU SATO, YASUTSUGU USAMI et al
Title:	METHOD AND AN APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON BEAM

Assignment: 1

Reel/Frame:

009388/0608

Recorded: 08/07/1998

Pages: 9

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

IWABUCHI, YUKO

Exec Dt:

07/31/1998

TODOKORO, HIDEO

Exec Dt:

07/31/1998

MORI, HIROYOSHI

Exec Dt:

07/31/1998

SATO, MITSUGU

Exec Dt:

07/31/1998

USAMI, YASUTSUGU

Exec Dt:

07/31/1998

ICHIHASHI, MIKIO

Exec Dt:

07/31/1998

FUKUHARA, SATORU

Exec Dt:

07/31/1998

SHINADA, HIROYUKI

Exec Dt:

07/31/1998

KANEKO, YUTAKA

Exec Dt:

07/31/1998

SUGIYAMA, KATSUJA

Exec Dt:

07/31/1998

TAKAFUJI, ATSUKO

Exec Dt:

07/31/1998

TOYAMA, HIROSHI

Exec Dt:

07/31/1998

Assignee:

HITACHI, LTD.

6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU

TOKYO 101, JAPAN

Correspondent:

KENYON & KENYON

JOHN C. ALTMILLER

1025 CONNECTICUT AVENUE, N.W.

WASHINGTON, DC 20036

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