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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/12/2002
Application #:
09553339
Filing Dt:
04/20/2000
Inventors:
Naohiko Fujino, Isamu Karino, Masahi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama
Title:
Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal display elements by use thereof
Assignment: 1
Reel/Frame:
016334/0537Recorded: 03/08/2005Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/14/2005
Assignee:
8, NAKASE 1-CHOME, MIHAMA-KU
CHIBA-SHI, CHIBA, JAPAN
Correspondent:
LAWRENCE J. MCCLURE, ESQ.
HOGAN & HARTSON L.L.P.
500 SOUTH GRAND AVENUE, SUITE 1900
LOS ANGELES, CA 90071

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