Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/19/2002
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Application #:
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09268666
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Filing Dt:
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03/16/1999
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Inventors:
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KUEN-JONG LEE, JING-YANE WU, WEN-BEN JONE
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Title:
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BUILT-IN SELF TEST FOR MULTIPLE MEMORIES IN A CHIP
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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18 FLOOR, NO. SEC. 2 |
HOPING E. ROAD |
TAIPEI, TAIWAN |
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JACOBSON, PRICE, HOLMAN ET AL. |
JOHN C. HOLMAN |
400 7TH STREET, NW |
WASHINGTON, DC 20004 |
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