Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09512439
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Filing Dt:
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02/25/2000
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Inventors:
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Seng Ghee Tan, Thomas Yun Fook Liew, Teck Ee Loh, Udaya Ahangama Silva
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Title:
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Method and apparatus for high throughput media defect testing using true reference value
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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DSI BUILDING |
5 ENGINEERING DRIVE 1 (OFF KENT RIDGE CRESCENT, NUS) |
SINGAPORE 11760 |
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COWAN, LIEBOWTIZ & LATMAN, P.C. |
MOREY B. WILDES |
1133 AVENUE OF THE AMERICAS |
NEW YORK, NY 10036-6799 |
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