Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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04/09/2002
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Application #:
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09458819
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Filing Dt:
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12/13/1999
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Inventors:
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AKIYUKI MINAMI, SATOSHI MACHIDA
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Title:
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RESIST MARK HAVING MEASUREMENT MARKS FOR MEASURING THE ACCURACY OF OVERLAY OF A PHOTOMASK DISPOSED ON SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER HAVING IT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-12, TORANOMON 1-CHOME |
| MINATO-KU, TOKYO 105, JAPAN |
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| OKI AMERICA, INC. |
| 1725 K STREET, N.W. |
| SUITE 1110 |
| WASHINGTON, D.C. 20006 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT RECEIVING PARTY'S NAME. AN ASSIGNMENT PREVIOUSLY RECORDED AT REEL 010450, FRAME 0376.
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| 7-12, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO 105, JAPAN |
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| OKI AMERICA, INC. |
| 1725 K STREET, N.W., SUITE 1110 |
| WASHINGTON, D.C. 20006 |
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Assignment:
3
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 550-1 HIGASHIASAKAWA-CHO |
| HACHIOJI-SHI, TOKYO, JAPAN 193-8550 |
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| KUBOTERA & ASSOCIATES, LLC |
| 200 DAINGERFIELD ROAD |
| SUITE 202 |
| ALEXANDRIA, VA 22314 |
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