Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/23/2002
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Application #:
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09265180
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Filing Dt:
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03/10/1999
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Inventors:
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BROOKE M. NOACK, TIM Z. HOSSAIN
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Title:
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SCATTERED INCIDENT X-RAY PHOTONS FOR MEASURING SURFACE ROUGHNESS OF A SEMICONDUCTOR TOPOGRAPHY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE AMD PLACE |
SUNNYVALE, CALIFORNIA 94088 |
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CONLEY, ROSE & TAYON, P.C. |
KEVIN L. DAFFER |
P.O. BOX 398 |
AUSTIN, TX 78767-0398 |
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