Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/25/2002
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Application #:
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09484655
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Filing Dt:
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01/24/2000
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Inventor:
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Christopher LEE Pike
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Title:
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MASK, STRUCTURES, AND METHOD FOR CALIBRATION OF PATTERNED DEFECT INSPECTIONS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE |
| SUNNYVALE, CALIFORNIA 94088 |
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| LAW OFFICES OF DAVIS CHIN |
| DAVIS CHIN |
| 111 W. WASHINGTON ST., SUITE 1025 |
| CHICAGO, IL 60603-2378 |
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