Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/24/2002
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Application #:
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09927469
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Filing Dt:
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08/13/2001
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Publication #:
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Pub Dt:
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08/08/2002
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Inventors:
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Hisaya Mori, Shinji Yamada, Teruhiko Funakura
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Title:
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EXTERNAL TEST ANCILLARY DEVICE TO BE USED FOR TESTING SEMICONDUCTOR DEVICE, AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME CHIYODA-KU |
| TOKYO 100-8310, JAPAN |
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| 1 MIZUHARA 4-CHOME |
| ITAMI-SHI, HYOGO 664-0005, JAPAN |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005 |
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