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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/01/2002
Application #:
09548580
Filing Dt:
04/13/2000
Inventors:
HISASHI OIKAWA, YASUO WATANABE
Title:
TESTING SYSTEM FOR SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
010735/0392Recorded: 04/13/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/07/2000
Exec Dt:
04/07/2000
Assignee:
NERIMA-KU
32-1, ASAHICHO 1-CHOME
TOKYO, JAPAN
Correspondent:
DELLETT AND WALTERS
JAMES H. WALTERS
310 S.W. FOURT AVENUE, SUITE 1101
PORTLAND, OR 97204

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