Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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10/15/2002
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Application #:
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09390503
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Filing Dt:
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09/03/1999
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Inventors:
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AVNER KARPOL, BOAZ KENAN
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Title:
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METHOD AND SYSTEM FOR RETICLE INSPECTION BY PHOTOLITHOGRAPHY SIMULATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| LEGAL AFFAIRS DEPARTMENT |
| P.O. BOX 450A |
| SANTA CLARA, CALIFORNIA 95054 |
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| APPLIED MATERIALS, INC. |
| ROBERT W. MULCAHY |
| LEGAL AFFAIRS DEPT. |
| P.O. BOX 450A, M/S 2061 |
| SANTA CLARA, CA 95052 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 450A |
| SANTA CLARA, CALIFORNIA 95052 |
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| APPLIED MATERIALS, INC. |
| PETER J. YIM |
| 2881 SCOTT BLVD., M/S 2061 |
| SANTA CLARA, CA 95050 |
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Assignment:
3
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SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
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| 270 PARK AVENUE |
| NEW YORK, NEW YORK 10017 |
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| FEDERAL RESEARCH CORPORATION |
| PIERO GUIDICE |
| 400 SEVENTH ST., N.W. |
| SUITE 101 |
| WASHINGTON, DC 20004 |
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