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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
6476388
Issue Dt:
11/05/2002
Application #:
09421093
Filing Dt:
10/19/1999
Inventors:
RYO NAKAGAKI, YUJI TAKAGI, ATSUSHI SHIMODA, KENJI OBARA, YASUHIKO OZAWA, HIDEKA BAMBA et al
Title:
SCANNING ELECTRON MICROSCOPE, DEFECT PORTION ANALYZING METHOD USING THE SAME AND APPARATUS AND METHOD OF AUTOMATICALLY SAMPLING IMAGE THEREOF
Assignment: 1
Reel/Frame:
010341/0072Recorded: 10/19/1999Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
NAKAGAKI, RYO
Exec Dt:
10/06/1999
TAKAGI, YUJI
Exec Dt:
10/06/1999
SHIMODA, ATSUSHI
Exec Dt:
10/06/1999
OBARA, KENJI
Exec Dt:
10/06/1999
KUROSAKI, TOSHIEI
Exec Dt:
10/06/1999
OZAWA, YASUHIKO
Exec Dt:
10/07/1999
BAMBA, HIDEKA
Exec Dt:
10/08/1999
ISOGAI, SEIJI
Exec Dt:
10/08/1999
WATANABE, KENJI
Exec Dt:
10/12/1999
SHISHIDO, CHIE
Exec Dt:
10/12/1999
Assignee:
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
MELVIN KRAUS
1300 NORTH SEVENTEENTH STREET
SUITE 1800
ARLINGTON, VA 22209

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