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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
6483584
Issue Dt:
11/19/2002
Application #:
09549738
Filing Dt:
04/14/2000
Inventors:
Solomon J. H. Lee, Chih-Kung Lee, ShuiSheng Lee, Yang Yun-Chang, Shuen-Chen Shiue et al
Title:
DEVICE FOR MEASURING THE COMPLEX REFRACTIVE INDEX AND THIN FILM THICKNESS OF A SAMPLE
Assignment: 1
Reel/Frame:
010735/0037Recorded: 04/14/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
LEE, SOLOMON J.H.
Exec Dt:
03/01/2000
LEE, CHIH-KUNG
Exec Dt:
03/01/2000
LEE, SHU-SHENG
Exec Dt:
03/01/2000
YUN-CHANG, YANG
Exec Dt:
03/02/2000
CHAN-CHING, LIN
Exec Dt:
03/02/2000
SHIUE, SHUEN-CHEN
Exec Dt:
02/29/2000
Assignee:
NATIONAL SCIENCE COUNCIL
18F, NO. 106, SEC. 2, HO-PING E. RD.
TAIPEI, TAIWAN R.O.C
Correspondent:
J. C. PATENTS, INC.
JIAWEI HUANG
1340 REYNOLDS AVE., SUITE 114
IRVINE, CA 92614

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