Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/26/2002
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Application #:
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09566814
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Filing Dt:
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05/08/2000
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Inventor:
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Hyung-Sik Kim
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Title:
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APPARATUS FOR MEASURING DEPTH AND GRADIENT OF TRENCH IN SEMICONDUCTOR DEVICE AND METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SAN 136-1, AMI-RI, BUBAL-EUB |
ICHON-SHI, KYOUNGKI-DO, KOREA, REPUBLIC OF |
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FLESHNER & KIM |
DANIEL Y.J. KIM |
P.O. BOX 221200 |
CHANTILLY, VA 20153-1200 |
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