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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/31/2002
Application #:
09644893
Filing Dt:
08/24/2000
Inventors:
Hidemitu Ogawa, Akira Hirabayashi, Katsuichi Kitagawa
Title:
SURFACE PROFILE MEASURING METHOD AND APPARATUS
Assignment: 1
Reel/Frame:
011258/0822Recorded: 10/27/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/10/2000
Exec Dt:
08/10/2000
Exec Dt:
08/17/2000
Assignees:
4-18, NAKANOSHIMA 3-CHOME, KITA-KU
OSAKA 530-0005, JAPAN
2-12-1 OOKAYAMA, MEGURO-KU
TOKYO 152-0033, JAPAN
Correspondent:
ARENT FOX KINTNER PLOTKIN & KAHN, PLLC
GEORGE E. ORAM, JR.
1050 CONNECTICUT AVENUE, NW
SUITE 600
WASHINGTON, D.C. 20036-5339
Assignment: 2
Reel/Frame:
020723/0390Recorded: 03/27/2008Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/26/2007
Assignee:
2-12-1 OOKAYAMA, MEGURO-KU
TOKYO, JAPAN
Correspondent:
LEE CHUNG
1100 17TH STREET, N.W., SUITE 503
WASHINGTON, D.C. 20036

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