Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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01/14/2003
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Application #:
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10067604
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Filing Dt:
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02/04/2002
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Inventors:
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Louis N. Koppel, William Johnson
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Title:
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SYSTEM AND METHOD FOR X-RAY REFLECTOMETRY MEASUREMENT OF LOW DENSITY FILMS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1250 RELIANCE WAY |
| FREMONT, CALIFORNIA 94539 |
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| STALLMAN & POLLOCK LLP |
| ATTN: BRIAN J. KEATING |
| 121 SPEAR STREET, SUITE 290 |
| SAN FRANCISCO, CA 94105 |
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Assignment:
2
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| 3003 TASMAN DR. |
| SANTA CLARA, CALIFORNIA 95054 |
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| BUCHALTER, NEMER & FIELD & YOUNGER |
| MRS. KIM WALKER |
| 601 SOUTH FIGUEROA ST., STE. 2400 |
| LOS ANGELES, CA 90017 |
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