Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/14/2003
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Application #:
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09524182
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Filing Dt:
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03/13/2000
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Inventor:
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Shiow-Hwan Sheu
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Title:
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METHOD FOR TESTING SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 19 LI-HSIN ROAD, SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN |
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| NO. 19 LI-HSIN ROAD, SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN |
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| WITTELSBACHERPLATZ 2, D-80333 |
| MUCHEN, GERMANY |
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| BLAKELY SOKOLOFF TAYLOR & ZAFMAN, LLP |
| CHUN M. NG |
| 12400 WILSHIRE BLVD., 7TH FLOOR |
| LOS ANGELES, CALIFORNIA 90025 |
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