Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/28/2003
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Application #:
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10004636
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Filing Dt:
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12/04/2001
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Inventors:
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Wen-Jer Tsai, Lan Ting Huang, Nian-Kai Zous, Ta-Hui Wang
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Title:
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RELIABILITY TEST METHOD AND CIRCUIT FOR NON-VOLATILE MEMORY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SCIENCE-BASED INDUSTRIAL PARK |
NO. 16, LI-HSIN ROAD |
HSINCHU, TAIWAN R.O.C |
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J.C. PATENTS, INC. |
JIAWEI HUANG |
4 VENTURE, SUITE 250 |
IRVINE, CALIFORNIA 92618 |
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