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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/04/2003
Application #:
09802914
Filing Dt:
03/12/2001
Publication #:
Pub Dt:
02/28/2002
Inventors:
Tetsuya Suzuki, Akira Okitsu
Title:
METHOD AND APPARATUS FOR TESTING IC DEVICE
Assignment: 1
Reel/Frame:
012004/0365Recorded: 07/24/2001Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/01/2001
Exec Dt:
02/01/2001
Assignee:
16-3, HIGASHI 3-CHOME, SHIBUYA-KU
TOKYO, JAPAN
Correspondent:
OBLON, SPIVAK, MCCLELLAND, ET AL.
MARVIN J. SPIVAK
1755 JEFFERSON DAVIS HIGHWAY
FOURTH FLOOR
ARLINGTON, VA 22202

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