Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/25/2003
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Application #:
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09081342
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Filing Dt:
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05/19/1998
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Inventors:
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BRIAN SAMUEL BEAMAN, KEITH EDWARD FOGEL, PAUL ALFRED LAURO, DA-YUAN SHIH et al
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Title:
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PROBE STRUCTURES FOR TESTING ELECTRICAL INTERCONNECTIONS TO INTEGRATED CIRCUIT ELECTRONIC DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| IBM CORPORATION |
| DANIEL P. MORRIS |
| INTELLECTUAL PROPERTY LAW |
| P.O. BOX 218 |
| YORKTOWN HEIGHTS, NY 10598 |
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