Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/22/2003
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Application #:
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10054985
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Filing Dt:
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01/25/2002
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Inventors:
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Chun-Lien Su, Chi-Yuan Chin, Ming-Shang Chen, Tsung-Hsien Wu, Yih-Shi Lin
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Title:
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METHOD AND CIRCUIT LAYOUT FOR REDUCING POST CHEMICAL MECHANICAL POLISHING DEFECT COUNT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 16, LI HSIN ROAD, SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN R.O.C |
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| LOWE HAUPTMAN GILMAN & BERNER |
| BENJAMIN J. HAUPTMAN |
| 1700 DIAGONAL ROAD, SUITE 310 |
| ALEXANDRIA, VA 22314 |
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