Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/29/2003
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Application #:
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09867600
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Filing Dt:
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05/31/2001
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Publication #:
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Pub Dt:
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12/06/2001
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Inventor:
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Eiji Yonezawa
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Title:
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DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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7-9, SAKAE-CHO, GAMAGORI-SHI |
AICHI, JAPAN |
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SUGHRUE, MION, ZINN, MACPEAK, ET AL |
DARRYL MEXIC |
2100 PENNSYLVANIA AVENUE, N.W. |
SUITE 800 |
WASHINGTON, D.C. 20037-3213 |
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