Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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05/06/2003
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Application #:
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09722074
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Filing Dt:
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11/27/2000
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Inventors:
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Keizo Yamada, Tohru Tsujide, Yousuke Itagaki, Takeo Ushiki
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Title:
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SEMICONDUCTOR DEVICE TESTER AND SEMICONDUCTOR DEVICE TEST METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| MCGUIREWOODS LLP |
| C. LAMONT WHITHAM, ESQ. |
| 1750 TYSONS BOULEVARD, SUITE 1800 |
| MCLEAN, VA 22102 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NISSEI SHINMIZONOKUCHI BLDG. 5F, 3-5-7 HISAMOTO, TAKATSU-KU, KAWASAKI |
| KANAGAWA 213-0011, JAPAN |
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| WHITHAM, CURTIS & CHRISTOFFERSON, PC |
| MICHAEL E. WHITMAN |
| 11491 SUNSET HILLS ROAD |
| #340 |
| RESTON, VA 20190 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 75-1 HASUNUMA-CHO, ITABASHI-KU |
| TOKYO, JAPAN 174-8580 |
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| NEIL A. STEINBERG |
| 2665 MARINE WAY |
| SUITE 1150 |
| MOUNTAIN VIEW, CALIFORNIA 94043 |
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