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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/20/2003
Application #:
09593955
Filing Dt:
06/15/2000
Inventors:
Atsushi Yoshida, Shunji Maeda, Takafumi Okabe, Hisashi Mizumoto, Mitsunobu Isobe
Title:
MICROSCOPIC DEFECT INSPECTION APPARATUS AND METHOD THEREOF, AS WELL AS POSITIONAL SHIFT CALCULATION CIRCUIT THEREFOR
Assignment: 1
Reel/Frame:
010882/0214Recorded: 06/15/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/24/2000
Exec Dt:
05/19/2000
Exec Dt:
05/22/2000
Exec Dt:
05/22/2000
Exec Dt:
05/18/2000
Assignee:
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
MELVIN KRAUS
1300 NORTH SEVENTEENTH STREET
SUITE 1800
ARLINGTON, VA 22209

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